The Importance of Powder X-ray Diffraction in Geology
Powder X-ray diffraction (XRD) serves as an excellent tool for investigating and selecting geological samples and specimens. Benchtop diffractometers are commonly used in geology for the analysis of minerals and rocks. They are used to determine the crystal structure and composition of geological samples, which can provide valuable information about the formation and history of the sample.
Introducing the TELLUS Diffractometer: A Breakthrough in Geology Analysis
The measurements conducted in this field require highly precise experimental equipment, measurement repeatability, and accurate qualitative and quantitative analysis during data processing. In light of these requirements, we have developed the TELLUS desktop powder X-ray diffractometer, which combines precision modern mechanics, reliable X-ray sources, and one of the best photon counting detectors. Our product can be used both in laboratories and on production lines with automated data registration.
Advantages of the TELLUS diffractometer:
- short analysis time (1-15 min);
- high experiment accuracy;
- small sample preparation requirements;
- high level of automation;
- high level of radiation protection;
- software is customizable and has a reference database.
Some factors that help to determine the analysis of geological samples using benchtop diffractometers include the type of mineral or rock being analyzed, the size and shape of the sample, and the desired level of precision and accuracy.
Mineral Sample Analysis with the TELLUS Diffractometer
An example of a mineral sample analysis is shown below. The experiment was performed with the following conditions:
- Cu radiation with Ni filter, Power 600 W (40 kW, 15 mA);
- scanning range from 10 to 100 degrees;
- step width 0.01°, сontinuous mode (total scan time about 15 minutes);
- 2.5° Soller slits, 8.0 mm beam mask, divergence slit 0,195˚ (0.3 mm).
Adapting to Specific Needs: Expansion Options and Accessories for the TELLUS Diffractometer
Various accessories enable the adaptation of the X-ray diffractometer to address specific tasks. The basic configuration allows for high-precision and rapid analysis of all types of geological samples. Additionally, depending on the client’s needs, the functionality of the diffractometer can be expanded by incorporating specialized optical modules, holders, as well as dedicated software and databases.
