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Analyzing measured X-ray diffractograms allows obtaining the following information about the investigated sample:
- From the angular positions of the diffraction peaks, one can determine the parameters of the crystalline lattice and, consequently, identify the phase composition of the sample under investigation.
- Mass ratios of different phases in multicomponent mixtures can be determined from the intensities of the diffraction peaks.
- The broadening of diffraction peaks can be used to estimate the magnitude of elastic stresses in crystalline grains, as well as the average grain size.
