An X-ray diffractogram is the measured dependence, obtained with a diffractometer, of the intensity of the scattered X-ray beam on the scattering angle.
Since X-ray diffraction is based on the reflection of radiation from atomic planes of crystalline materials, the measured diffraction pattern is determined by the parameters of the crystal lattice of the sample under investigation.
The uniqueness of the crystalline properties of substances (sometimes – groups of substances) allows identifying different phases in the investigated mixture of previously unknown crystalline substances by the position and intensity of diffraction peaks, as well as determining their mass ratio.
Thus, measuring X-ray diffractograms is a powerful tool for analyzing the structure of materials and is widely used in various fields, including materials science, physics, chemistry, and biology.
