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X-ray diffraction (XRD) determines material crystal properties by analyzing its X-ray diffraction pattern, or diffractogram, recorded by an X-ray diffractometer.
Diffraction peaks unveil lattice parameters, phase composition. Intensity and broadening estimate stress, grain size.
The phenomenon of x-ray diffraction is based on the interference of X-ray radiation reflected from various atomic planes within a crystalline lattice.
An X-ray diffractogram is the measured dependence, obtained with a diffractometer, of the intensity of the scattered X-ray beam on the scattering angle.
A diffractometer can be utilized to analyze various types of crystalline samples, as well as samples with a mixture of amorphous phases, including powdered materials, polycrystalline films, bulk pieces, etc.
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- Analytical: Diffraction & Spectroscopy
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