X-ray methods have been among the most powerful and versatile instruments in scientific research, medicine, and technology for over a century. The unique properties of X-ray radiation make it possible to carry out non-destructive diagnostics, introspection, to detect certain types of substances and to investigate their properties. It can be said that since the wavelength of X-rays is comparable to the characteristic distance of interatomic bonds, it allows us to look deep into matter.
X-ray diffraction (XRD) basics
One of the main and widely sought-after areas of X-ray research is X-ray crystallography analysis, which answers basic questions about the crystal structure of matter and its properties. X-ray diffractometry is an effective method of X-ray crystallography analysis.
The phenomenon of X-ray diffraction is based on the interference of X-ray radiation reflected from various atomic planes within a crystalline lattice. The consequence of this interference is the appearance of distinct directions in space corresponding to intensity maxima.
The diffraction pattern, i.e., the distribution of intensity of the reflected X-ray radiation as a function of angle, is determined by the parameters of the crystalline lattice, which can be relatively quickly and easily calculated from the measured diffractograms.
Parameters of the crystalline lattice determined in this manner enable qualitative and quantitative analysis of the investigated sample with high precision.
One of the main and widely sought-after areas of X-ray research is X-ray crystallography analysis, which answers basic questions about the crystal structure of matter and its properties. X-ray diffractometry is an effective method of X-ray crystallography analysis.
The phenomenon of
y diffraction is based on the interference of X-ray radiation reflected from various atomic planes within a crystalline lattice. The consequence of this interference is the appearance of distinct directions in space corresponding to intensity maxima.
An X-ray diffractogram is the measured dependence, obtained with a diffractometer, of the intensity of the scattered X-ray beam on the scattering angle.
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