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Enhance baggage inspection precision with Smart Zoom technology, seamlessly integrated into LINEV Systems scanners for clearer images.
Diffraction peaks unveil lattice parameters, phase composition. Intensity and broadening estimate stress, grain size.
How imaging breakthroughs revolutionize forensic anthropology, enhancing documentation and trauma analysis?
Uncover ancient mummy secrets with X-ray revelations. Explore animal and human mummification, discover remarkable findings, and advancements in research.
An X-ray diffractogram is the measured dependence, obtained with a diffractometer, of the intensity of the scattered X-ray beam on the scattering angle.
This article examines battery sorting systems' principles, sensor-based methods, sorting techniques (e.g., machine vision, magnetic resonance), AI's role, and quality control measures. It emphasizes their vital role in recycling and environmental sustainability.
A diffractometer can be utilized to analyze various types of crystalline samples, as well as samples with a mixture of amorphous phases, including powdered materials, polycrystalline films, bulk pieces, etc.
The phenomenon of x-ray diffraction is based on the interference of X-ray radiation reflected from various atomic planes within a crystalline lattice.
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